Electron Microscopy


     The Electron Microscopy facilities in our lab include two TEMs, an SEM-FIB dual system and a fully equipped room for specimen preparation. Among the two TEMs, JEOL 200CX is used for conventional analytical TEM investigations and JEM ARM 200F for high-resolution analytical TEM investigations including HRTEM, STEM, EELS, EDS, EFTEM. The TESCAN Lyra 3 XMU SEM-FIB system TESCAN Lyra 3 XMU SEM-FIB is used for thin lamella preparations, but also for morphological, analytical and structural investigations via SEM, EDS and EBSD.


Investigation possibilities:


  • Microstructural and morphological characterization of nanostructured materials (powders, nanowires), thin films, ceramics, alloys by TEM/HRTEM and SEM.
  • Structural characterization down to atomic resolution of extended defects in crystalline materials.
  • Characterization of strain fields associated with extended defects and interfaces.
  • Chemical elemental composition measurements by EDS and EELS.
JEOL 2100

JEOL 2100

Configuration :

· LaB6 Gun;

· STEM Unit;

· EDS Unit: JEOL JED-2300T, with Dry SDD, detection area of 30 mm2 ;

· NanoMEGAS ASTAR system;

· CCD Camera: emSIS Tengra;


Working modes :

· CTEM, HRTEM, STEM BF, STEM ADF, STEM HAADF, SAED, nano-ED, CBED, EDS;


Technical specifications :

· Accelerating voltages: max. 200 kV;

· TEM magnification: 1 500 – 1 500 000 × ;

· TEM resolution: 0.19 nm (UHR pole piece), 0.25 nm (HT pole piece);

· STEM magnification: 200 – 150 000 000 × ;

· STEM-HAADF resolution: 0.08 nm ;

· EDS :
     - energy resolution EDS: 131,4 eV (Mn-Ka)
     - in TEM mode;
     - in STEM mode: spot, line profile or 2D mapping;

JEOL JEM ARM 200F

JEOL JEM ARM 200F

Configuration :

· Field Emission Gun (FEG);

· Cs-corrector for STEM mode;

· STEM Unit;

· EDS Unit: JEOL JED-2300T;

· GIF (Gatan Image Filter): Gatan Quantum SE;

· CCD Cameras : wide angle: Gatan Orius 200D, bottom mounted: Gatan Ultrascan 1000XP, GIF camera: Gatan Ultrascan 1000FT;


Working modes :

· CTEM, HRTEM, STEM BF, STEM ADF, STEM HAADF, SAED, nano-ED, CBED, EDS, EELS, EFTEM, EELS-SI;


Technical specifications :

· Accelerating voltages: max. 200 kV;

· TEM magnification: 50 – 2 000 000 × ;

· TEM resolution: 0.19 nm;

· STEM magnification: 200 – 150 000 000 × ;

· STEM-HAADF resolution: 0.08 nm ;

· EDS :
     - energy resolution EDS: 131,4 eV (Mn-Ka)
     - in TEM mode;
     - in STEM mode: spot, line profile or 2D mapping;

· EELS – energy resolution 0.7 eV ;

JEOL 200CX Analytical TEMSCAN

JEOL 200CX Analytical TEMSCAN

Characteristics :

· Medium resolution pole piece (0.4 nm);

· High resolution pole piece (0.2 nm lattice resolution);

· Single tilt +/-60o;

· Double tilt goniometer;

· In situ single tilt (+/- 45 degrees);

· Single tilt heating holder RT – 1000oC;

· Single tilt cooling holder -200oC – RT;

· Stretching holder – fracture/deformation observation;

· Faraday cage measurements

TESCAN LYRA 3 XMU SEM-FIB

TESCAN LYRA 3 XMU SEM-FIB

Working modes and technical specifications :


· SEM :
- Field Emission Gun (FEG)
- Accelerating voltage: 200 V – 30 kV
- Detectors: secondary electrons (SE), backscattered electrons (BE)
- Resolution SE: 1.2 nm at 30 kV in High Vacuum Mode 1.5 nm at 30 kV in Low Vacuum Mode
- Resolution BSE: 2.0 nm at 30 kV


· FIB :
- Ga source, 1500 h lifetime
- Accelerating voltage: 0.5 - 30 kV
- Detectors: secondary electrons (SE)
- Resolution: 5 nm at 30 kV


· EBSD :
- Bruker e-Flash 1000
- Pattern acquisition rate – up to 880 patterns/sec
- Pattern indexation rate – up to 750 patterns/sec for single phase

Specimen Preparation

Specimen Preparation

· Wire saw;

· Lapping machines;

· Zeiss Axio Observer reversed metallographic microscope for monitoring the thinning/polishing stages;

· Zeiss Stemi 2000 stereoscopic optical microscope for TEM specimen manipulation;

· Gatan PIPS ion milling installations;

· JEOL JEE 4C vacuum evaporator;

· Gatan ultrasound disc cutter;

· Gatan Dimple Grinder;

GHICA Corneliu Senior Researcher I
Head of the laboratory
Personal Page
TEODORESCU Valentin Serban Senior Researcher I
Ph.D. Supervisor
-
NISTOR Leona Cristina Senior Researcher I Personal Page
MARALOIU Valentin-Adrian Researcher III Personal Page
KUNCSER Andrei Cristian Researcher -
MERCIONIU Ionel Florinel Researcher Personal Page
NEGREA Raluca Researcher Personal Page
ION Anton Tehnician I -
FLORESCU Viorica Tehnician II -

Available techniques




Conventional TEM & SAED Morphological and structural characterization: Conventional TEM & SAED
HR TEM-STEM High resolution TEM/STEM
EDS-EELS TEM Spectroscopy: Energy Dispersive X-ray Spectroscopy & Electron Energy Loss Spectroscopy
EELS-SI Electron Energy Loss Spectroscopy – Spectrum Imaging (EELS-SI)
EDX mapping Energy Dispersive X-ray Spectroscopy mapping
EFTEM Energy Filtered Transmission Electron Microscopy (EFTEM)


Selected Publications



1. A. Tamion; M. Hillenkamp; A. Hillion; V.A. Maraloiu; I.D. Vlaicu; M. Stefan; D. Ghica; H. Rositi; F. Chauveau; M.-G. Blanchin; M. Wiart; V. Dupuis; Ferritin surplus in mouse spleen 14 months after intravenous injection of iron oxide nanoparticles at clinical dose; Nano Research; 9 (8), 2398-2410 (2016)
2. Scarisoreanu N.D, Craciun F., Birjega R., Ion V., Teodorescu V.S, Ghica C., Negrea R., Dinescu M.; Joining Chemical Pressure and Epitaxial Strain to Yield Y-doped BiFeO3 Thin Films with High Dielectric Response; Scientific Reports, 6 (2016)
3. VA Maraloiu, F Appaix, A Broisat, D Le Guellec, VS Teodorescu, C Ghezzi, Bvd Sanden, MG Blanchin; Multiscale investigation of USPIO nanoparticles in atherosclerotic plaques and their catabolism and storage in vivo; Nanomedicine: Nanotechnology, Biology and Medicine 12 (1), 191-200 (2016)
4. M. Stefan, D. Ghica, S. V. Nistor, A. V. Maraloiu, R. Plugaru; Mn2+ions distribution in doped sol–gel deposited ZnO films; Applied Surface Science; (2016); doi : 10.1016/j.apsusc.2016.02.167
5. VS Teodorescu, AV Maraloiu, RF Negrea, D Ghica, ND Scarisoreanu, M Dinescu, M Gartner, M-G Blanchin, High atomic diffusivity during pulsed laser irradiation of TiON quasi-amorphous films, Applied Surface Science; 374, 248-251 (2016)
6. Rusen E., Diacon A., Mocanu A., Gavrila R., Nistor L.C, Dinescu A.; CdSe (quantum dots)-graphene oxide system for thiophene polymerization: a new strategy, a new material; Rsc Advances, 6(30):25577-25583 (2016)
7. Nistor S.V, Stefan M., Nistor L.C, Ghica D., Vlaicu I.; Distribution and interaction of Mn2+ ions incorporated in cubic ZnS quantum dots over a broad concentration range; Journal of Alloys and Compounds, 662:193-199 (2016)
8. Rusen E., Diacon A., Mocanu A., Nistor L.C.; Novel facile method for obtaining CdSe/polyaniline/C-60 composite materials; Scientific Reports, 6 (2016)
9. Trinca L., Galca A.C, Aldica G.V, Radu R., Mercioniu I., Pintilie L.; On the growth of conductive aluminum doped zinc oxide on 001 strontium titanate single crystals; Applied Surface Science, 364:365-370 (2016)
10. Teodorescu, V. S. ; Ghica, C.; Maraloiu, A.V.; Vlaicu, M.; Kuncser, A.; Ciurea, M. L.; Stavarache, I.; Lepadatu, A. M.; Scarisoreanu, N.D.; Andrei, A.; Ion, V.; Dinescu, M.; Nanostructuring of GeTiO amorphous films by pulsed laser irradiation; BEILSTEIN JOURNAL OF NANOTECHNOLOGY; 6; 893-900 (2015)
11. Rusen E., Mocanu A., Nistor L.C, Hudhomme P., Diacon A.; Anionic polymerization by an electron transfer process from a CdSe quantum dot-perylenediimide (PDI) system; Rsc Advances, 5:28228-28232 (2015)
12. Negrea R.F, Teodorescu V.S, Ghica C.; Atomic scale elemental mapping of light elements in multilayered perovskite coatings. Applied Surface Science. 355:250-255 (2015)
13. Acsente T., Negrea R.F, Nistor L.C, Logofatu C., Matei E., Birjega R., Grisolia C., Dinescu G; Synthesis of flower-like tungsten nanoparticles by magnetron sputtering combined with gas aggregation; European Physical Journal D. 69 (2015)
14. Vajda K., Kasa Z., Dombi A., Nemeth Z., Kovacs G., Danciu V., Radu T., Ghica C., Baia L., Hernadi K. et al.; "Crystallographic" holes: new insights for a beneficial structural feature for photocatalytic applications; Nanoscale, 7:5776-5786 (2015)
15. Ghica C., Negrea R.F, Nistor L.C, Chirila C., Pintilie L.; Nanoscale monoclinic domains in epitaxial SrRuO3 thin films deposited by pulsed laser deposition; Journal of Applied Physics, 116 (2014)
16. Krishnan G., Negrea R.F, Ghica C., Brink G.H ten, Kooi B.J, Palasantzas G.; Synthesis and exceptional thermal stability of Mg-based bimetallic nanoparticles during hydrogenation; Nanoscale, 6:11963-11970 (2014)
17. Rusen E., Mocanu A., Nistor L.C, Dinescu A., Calinescu L., Mustatea G., Voicu S.I, Andronescu C., Diacon A.; Design of Antimicrobial Membrane Based on Polymer Colloids/Multiwall Carbon Nanotubes Hybrid Material with Silver Nanoparticles; ACS Applied Materials & Interfaces, 6:17384-17393 (2014)

Laboratory of Atomic Structures and Defects in Advanced Materials