Ph.D. Corneliu Ghica

Dr. Corneliu GHICA

Senior Researcher I

Telephone :
+40-21-369.01.85 / int.108
Duty GSM :
+40.(0).725.216.019
Email :

Head of the Laboratory of Atomic Structures and Defects
in Advanced Materials (LASDAM).

Education

1994 - University of Bucharest, Faculty of Physics
B. Sc. Optics and laser processing technologies, 1994


1995 - University of Bucharest, Faculty of Physics
M. Sc. Optics and processing technologies with laser and plasma, 1995


2001 - Louis Pasteur University, Strasbourg and University of Bucharest, Faculty of Physics
Ph. D. in Physics (co-tutorial) - growth, structure and properties of materials, thesis title: "Study of thin films deposited by laser ablation: colossal magnetoresistive manganites"

Working periods abroad

1994-1995 - M. Sc. student at Institut de Physique et Chimie des Matériaux de Strasbourg, France, specialisation in HRTEM, studies on PLD thin films of CNx (5 months).


1997-2000 - PhD student at Institut de Physique et Chimie des Matériaux de Strasbourg, France, HRTEM studies on magnetoresistive PLD thin films (4 months per year).


1998-1999 - Visiting researcher at the EMAT Department, University of Antwerp, Belgium, in-situ TEM studies on Co silicidation on patterned Si substrates (3 months).


2001-2002 - Post-doc position at Département de Physique des Matériaux, Claude-Bernard Lyon I University, Lyon, France, sol-gel growth and HRTEM characterization of SnO2:Sb thin films for OLED fabrication (10 months).


2003-2007 - Visiting researcher at the EMAT Department, University of Antwerp, Belgium, study of extended defects in hydrogen RF-plasma treated Si wafers (3 months per year).

Hands-on experience
  • Thin film deposition by PVD, PLD and sol-gel
  • Operation of several types of electron microscopes:
    • TEM : JEM ARM 200F, JEOL 4000 EX, JEOL 200 CX, JEOL 100 CX, Topcon 002B,
      Philips CM 20
    • SEM/SEM-FIB: JEM 5510, TESCAN Lyra III XMU
  • User of dedicated software for image processing and simulation such as Digital Micrograph, iTEM, Crystal Kit, Mac Tempas, EMS, Adobe Photoshop
  • TEM specimen preparation (powders, thin films, ceramics) using the tripod technique, Gatan dimple grinder, Balzers RES 010, Gatan Dou Mill 600 and Gatan PIPS installations.
Main topics of present interest
  • TEM/HRTEM characterization of extended defects in crystalline materials.
  • Quantitative HRTEM characterization of strain fields associated with extended defects and interfaces.
  • Analytical microstructural characterization of thin films and nanostructures by HRTEM, STEM, EDS, EELS.
Researcher ID
http://www.researcherid.com/rid/B-7591-2011